Emerson has introduced new radio frequency (RF) testing capabilities through the NI PXIe-5633 four-port vector network analyser (VNA) and software enhancements for the NI PXIe-5860 vector signal transceiver (VST). The additions extend the company’s NI PXI platform to support multiport S-parameter measurements and multiple-input multiple-output (MIMO) testing.
The new capabilities are intended to help engineers characterise complex RF devices, support synchronised multichannel testing and consolidate network analysis and modulated RF measurements within a single test system.
The NI PXIe-5633 extends NI’s existing vector network analysis capabilities to four ports, enabling engineers to measure more complex RF architectures and assess interactions across multiple signal paths. The NI PXIe-5860 software enhancements support synchronisation-focused workflows for advanced MIMO, multichannel and timing-sensitive wireless applications.
S-Parameter Measurements and Modulated RF Testing in a Single PXI System
Engineers can also perform S-parameter characterisation alongside modulated RF measurements through a single RF connection. Integrating these measurements within one software-driven PXI system can reduce the need for separate instruments and test setups while supporting automated measurement workflows.
NI PXI Platform: From Design Validation to Production Testing
The platform is designed to scale automated testing from design validation to production, with applications spanning semiconductor validation, advanced wireless research, aerospace and defence systems, and other RF-intensive technologies.
Emerson at European Microwave Week: 4x4 MIMO Demonstration
Emerson is demonstrating the new capabilities at European Microwave Week at booth A40B, featuring a 4x4 MIMO setup using the NI PXIe-5860 and the four-port VNA.
Kevin Schultz, NI chief technology officer within Emerson’s test and measurement business, said the increasing use of distributed, software-defined and antenna-intensive wireless systems is driving the need for test architectures that can accommodate more complex system-level validation requirements.